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Polished Single Crystal Silicon Wafer for SEM AFM XRD, Square Si Wafer Substrate Laboratory Analysis Wafer 8x8mm SSP 0.01mm
NGN 41765
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High-performance silicon wafer with conventional surface chemical stability on SiO₂ substrate.
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What Stands Out
Product Details
Who Should Buy?
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Research Scientists
Ideal for scientists needing high-quality wafers for microstructural analysis via SEM, AFM, and XRD techniques.
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Material Engineers
Engineers can utilize this wafer for developing novel materials or investigating material properties at a microscale.
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Educational Purposes
Perfect for laboratories in educational institutions to demonstrate advanced wafer analysis methodologies to students.
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Hobbyists
Amateurs may find professional-grade wafers overly specialized and unsuitable for their non-scientific experiments or projects.
Product Description
Polished Single Crystal Silicon Wafer for SEM AFM XRD, Square Si Wafer Substrate Laboratory Analysis Wafer 8x8mm SSP 0.01mm
Customer Questions & Answers
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Question:
Can the silicon wafers be customized?
Answer: Yes, sizes and thicknesses can be customized to meet your specific needs. -
Question:
What types of doping are available?
Answer: Both N-type and P-type doping options are available, along with intrinsic silicon. -
Question:
What applications are these wafers suitable for?
Answer: They are ideal for surface characterization, materials research, and various analytical instruments.
XUSILAOK Crystals Editorial Review
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NGN 41765
Order now and get it around Sunday, August 30
This item is not restrict in my country.(Please click on above link if this item is not restrict in your country, So our team will review and allow.)
QTY:
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Features & Benefits
- Available in various sizes from 1mm to 50mm.
- Customizable thickness options including 525um, 625um, and 725um.
- Supports N-type and P-type doping for versatile applications.
- Precision polished for smooth and flat surface ideal for research.
- Manufactured from high-quality monocrystalline silicon ensuring uniformity.
- Compatible with SEM, AFM, and XRD for cutting-edge material analysis.
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